QuarkNet at Wayne State University

QuarkNet at Johns Hopkins University

Parameterization of Flux Graphs

Emi Ahlo - Kamehameha Schools Kapalama, Honolulu, HI
Using flux graphs, the reliability of a Student Cosmic Ray Detector can be identified. Analysis of
numerous detectors with a variety of geometry and parameters have produced specific detector data
characteristics that identify reliable detectors. The two most telling properties are a horizontal best fit
line in the flux plots, and no more than 15% of a deviation from that line.

Altitude vs. Muon Lifetime

Kahiwakuikanaulu Hoe - Kamehameha Schools Kapalama
In order to analyze the relationship between muon decay time and elevation from sea level, muon
detectors from around the world were reviewed for accuracy. The amount of flux and the consistency of
the detector were the primary factors to monitor, and the lifetimes of each school along with its
respective elevation were plotted to show a positive correlation between 40 m and 240 m of elevation,
but higher altitudes had too few data points to draw a notable conclusion.

Cosmic Shower Parametrization and CME Hazard Prognosis

John Mailolo - Kamehameha Schools Kapalama
Cosmic showers are a natural event caused by radiation, which may produce negative and mutagenic
effects within human populations. This study defines the parameterization to measure and detect
increased levels of cosmic radiation, utilizing solar flare data first, then flux levels.
In addition to parametrization, this methodology predicts a correlation with cosmic radiation on Earth,
within one to three days. This parameterization also highlights the potential boundaries at which solar

Comparing EUV and LOS Magnetic Field Images to Determine if Coronal Holes are a Part of the Solar Cycle

Zain Jabbar - Maui High School

Hydroponic System Simulation of UVC Effects on Plant Growth for Mars

OneJae Lee – Maui High School

Constructing a Raspberry Pi Muon Detector

Mary Chin - Maui High School

FSU QuarkNet Center Report 2017

University of Oregon Annual Report